Please use this identifier to cite or link to this item:
http://arks.princeton.edu/ark:/88435/dsp01js956h85jFull metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Sturm, James | en_US |
| dc.contributor.author | Cullen, Charles W. | en_US |
| dc.date.accessioned | 2014-09-22T17:04:50Z | - |
| dc.date.available | 2014-09-22T17:04:50Z | - |
| dc.date.issued | 1994 | en_US |
| dc.identifier.other | 5701 | en_US |
| dc.identifier.uri | http://arks.princeton.edu/ark:/88435/dsp01js956h85j | - |
| dc.format.extent | 19 Pages | en_US |
| dc.title | Double-Pass, Infrared Absorption for Temperature Measurement of Silicon Wafers with Blanket Metal Coverage | en_US |
| dc.type | Princeton University Senior Theses | en_US |
| pu.projectgrantnumber | 690-2143 | en_US |
| pu.date.classyear | 1994 | en_US |
| pu.department | Electrical Engineering | en_US |
| pu.location | This thesis can be viewed in person at the <a href=http://mudd.princeton.edu>Mudd Manuscript Library</a>. To order a copy complete the <a href="http://rbsc.princeton.edu/senior-thesis-order-form" target="_blank">Senior Thesis Request Form</a>. For more information contact <a href=mailto:mudd@princeton.edu>mudd@princeton.edu</a>. | en_US |
| Appears in Collections: | Electrical Engineering, 1932-2020 | |
Files in This Item:
There are no files associated with this item.
Items in Dataspace are protected by copyright, with all rights reserved, unless otherwise indicated.