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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp01fb4948877
Title: An Application of Expert Systems for Semiconductor Memory Testing
Authors: McGwire, Jr., John Marston
Department: Civil Engineering and Operations Research
Class Year: 1984
Extent: 84 Pages
URI: http://arks.princeton.edu/ark:/88435/dsp01fb4948877
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Civil Engineering and Operations Research, 1931-2000

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