Please use this identifier to cite or link to this item:
http://arks.princeton.edu/ark:/88435/dsp018s45qc280| Title: | Current Reduction Caused by the Generation of Interface States in the Si-SiO2 System |
| Authors: | Han, Chien-Jih |
| Advisors: | Johnson, Walter C. |
| Department: | Electrical Engineering |
| Class Year: | 1980 |
| Extent: | 47 pages |
| Other Identifiers: | 27472 |
| URI: | http://arks.princeton.edu/ark:/88435/dsp018s45qc280 |
| Location : | This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu. |
| Type of Material: | Princeton University Senior Theses |
| Language: | en_US |
| Appears in Collections: | Electrical Engineering, 1932-2020 |
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