Please use this identifier to cite or link to this item:
http://arks.princeton.edu/ark:/88435/dsp018623j076z| Title: | Exploiting Secuity Holes in Modern RFID Systems: A Study of Vulnerabilities in ISO15693 |
| Authors: | Norair, John |
| Advisors: | Lerch, John |
| Department: | Electrical Engineering |
| Class Year: | 2004 |
| Extent: | 14 Pages |
| Format: | Contains color or special media |
| Other Identifiers: | 17758 |
| URI: | http://arks.princeton.edu/ark:/88435/dsp018623j076z |
| Location : | This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu. |
| Type of Material: | Princeton University Senior Theses |
| Appears in Collections: | Electrical Engineering, 1932-2020 |
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