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Please use this identifier to cite or link to this item: http://arks.princeton.edu/ark:/88435/dsp0176537338m
Title: A dI/dt stressmark for the Intel Net Burst Microarchitecture
Authors: Agrawal, Abhinav
Advisors: Martonosi, Margaret
Department: Electrical Engineering
Class Year: 2003
Extent: 16 Pages
Format: Contains color or special media
Other Identifiers: 16678
URI: http://arks.princeton.edu/ark:/88435/dsp0176537338m
Location : This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.
Type of Material: Princeton University Senior Theses
Appears in Collections:Electrical Engineering, 1932-2020

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