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http://arks.princeton.edu/ark:/88435/dsp011g05fd645| Title: | Microelectronic Device Vulnerability: An Experiment in Low-Level Energy/Information Tranfer: Part II |
| Authors: | Cook, Ian Ainsworth |
| Department: | Electrical Engineering |
| Class Year: | 1982 |
| Extent: | 31 Pages |
| Other Identifiers: | 3083 |
| URI: | http://arks.princeton.edu/ark:/88435/dsp011g05fd645 |
| Location : | This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu. |
| Type of Material: | Princeton University Senior Theses |
| Appears in Collections: | Electrical Engineering, 1932-2020 |
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