Browsing by Academic Advisor Sturm, James
Showing results 1 to 17 of 17
Class Year | Author(s) | Title | Advisor |
2016 | Danielczuk, Michael | Creating a Flat Flexible Microphone Array | Sturm, James |
1992 | Rim, Kern | Design and Performance Estimation of RT CVD Grown SESA Si-Ge HBT | Sturm, James |
1998 | Lanford, William; Lanford, William | Design, Fabrication, and Analysis of Integrated Circuits Utilizing Amorphous Silicon Thin-Film Transistors on Steel Foil Substrates | Sturm, James |
2018 | Kolstad, Anna | Developing a thin-film multielectrode array system for neuron sensing in three-dimensions | Sturm, James |
1994 | Cullen, Charles W. | Double-Pass, Infrared Absorption for Temperature Measurement of Silicon Wafers with Blanket Metal Coverage | Sturm, James |
- | Lalgudi Visweswaran, Bhadrinarayana | Encapsulation of Organic Light Emitting Diodes | Wagner, Sigurd; Sturm, James |
2019 | Wang, Matt | Fabrication of Highly-Porous Stress-Free 3D-Compatible Flexible Neural Probes | Sturm, James |
1991 | Manoharan, Harindran C. | Growth and Study of Strained-layer Si/Si1-xGex Heterostructures | Sturm, James |
- | Huo, Weiguang | Growth of Atomically-flat Si/SiGe Heterostructures by Ultra-High-Vacuum Chemical Vapor Deposition | Sturm, James |
1989 | Nayak, Jawahar | High-Frequency Capacitance Measurement of Metal-Oxide-Semiconductor Capacitors | Sturm, James |
2000 | Bakker, Timothy C. | Investigation of InGaAs Photon Assisted Carrier Diffusion | Sturm, James |
2000 | Bakker, Timothy C. | Investigation of Photon Diffusion in InGaAs Linear Photodiode Array | Sturm, James |
1990 | Meleis, Waleed | An Investigation of the NECC PD79ID Charge Coupled Imaging Device | Sturm, James |
2016 | Weaver, Campbell | The LASS System: Structural Health Monitoring By Large Area Strain Detection | Sturm, James |
2000 | Madigan, Conor | Polymer Organic Light Emitting Diode Patterning by Ink Jet Printing | Sturm, James |
2019 | Ge, Andrew | System Integration for Implementation of 3D Neural Probe | Sturm, James |
1992 | Aytur, Turgut S. | VLSI Delay Estimation Based on Process Parameter Variances | Sturm, James |